Доклады Академии наукДоклады Академии наук0869-5652The Russian Academy of Sciences1547010.31857/S0869-56524872159-163Research ArticleThe formation of nanowhiskers in syntactic foam containing tungsten under nanosecond flow of relativistic electronsMilekhinYu. M.<p>Academician of the Russian Academy of Sciences</p>soyuz@fcdt.ruSadovnichiiD. N.soyuz@fcdt.ruSheremetyevK. Yu.soyuz@fcdt.ruKalininYu. G.soyuz@fcdt.ruKazakovE. D.soyuz@fcdt.ruMarkovM. B.soyuz@fcdt.ruFederal Center of Dual Use Technologies SoyuzNational Research Centre "Kurchatov Institute"National Research University Moscow Power Engineering InstituteInstitute for Applied Mathematics of the Russian Academy of Sciences3107201948721591632707201927072019Copyright © 2019, Russian academy of sciences2019<p>The results of experimental studies of the nanowhiskers formation under the influence of relativistic electron beams of nanosecond duration on syntactic foam containing tungsten are presented. We demonstrated effects which observed after a single impact of relativistic electron beams with a flux density of 230-240 J/cm<sup>2</sup> and a total pulse duration of 150 ns. The spheres with diameter of more than 40 m are destroyed in irradiated syntactic foam. Filamental structure is formed on the surface of such spheres. Its length is up to 10 m and a diameter of about 100 nm. The complex kinetics substance expansion from the irradiated surface was found out. The speeds of gas-plasma formations expansion reached ~ 13 km/s. It was found that nanowhiskers are not formed near the emission crater from syntactic foam, where the duration of the mechanical pressure pulse is minimal and close to the duration of the relativistic electron beam impact.</p>nanowhiskersspheroplasticsyntactic foamsflow of relativistic electronsabsorbed dosenanosecond pulseнановискерысферопластиксинтактические пеныпоток релятивистских электроновпоглощённая дозананосекундный импульс[Третьяков Ю. Д., Гудилин Е. А. // Успехи химии. 2009. Т. 78. № 9. С. 867-887.][Дубровский В. Г., Цырлин Г. Э., Устинов В. М. // Физика и техника полупроводников. 2009. Т. 43. В. 12. С. 1586-1628.][Сыркин В. Г. CVD метод. Химическое парофазное осаждение. М.: Наука, 2000. 496 с.][Frigeri P., Seravalli L., Trevisi G., Franchi S. Comprehensive Semiconductor Science and Technology. V. 3. Materials, Preparation, and Properties. Amsterdam etc.: Elsevier, 2011. P. 480-522.][Ананьев С. С., Багдасаров Г. А., Гасилов В. А. и др. // Физика плазмы. 2017. Т. 43. № 7. С. 608-615.][Берлин А. А., Шутов Ф. А. Упрочненные газонаполненные пластмассы. М.: Химия, 1980. 224 с.][Meng X.-F., Shen X.-Q., Liu W. // Appl. Surface Sci. 2012. V. 258. № 7. P. 2627-2631.][Демидов Б. А., Ефремов В. П., Казаков Е. Д. и др. // Приборы и техника эксперимента. 2016. № 2. С. 96-99.][Gupta N., Woldesenbet E. // J. Cellular Plastics. 2004. V. 40. P. 461-480.][Сакович Г. В., Жарков А. С., Петров Е. А. // Рос. нанотехнологии. 2013. Т. 8. № 9/10. С. 11-20.][Ремпель А. А. // Успехи химии. 2007. Т. 76. № 5. С. 474-500.][Крауз В. И., Химченко Л. Н., Мялтон В. В. и др. // Физика плазмы. 2013. Т. 39. № 4. С. 326-332.][Семенова А. А., Гудилин Е. А., Семенова И. А. и др. // ДАН. 2011. Т. 438. № 4. С. 490-493.][Гафаров Б. Р., Ефремов В. П., Садовничий Д. Н. и др. // Хим. физика. 2001. Т. 20. № 4. С. 66-72.][Будов В. В. // Пробл. прочности. 1991. № 5. С. 68-70.]