The microwave integral devices in microstrip transmittion lines parameters identification by experimental results method

Abstract

This article describes the new parameter identification method which can be applied for the contact device to measure S-parameters of integral structures in microstrip transmitting lines. Experimental data employed in identification process has been received over measuring the chains of test board-contact device at reflecting and transmitting lengths of coupled transmission lines by using spectrum analyzer. S-parameters of measurable resistive integral structures and coaxial-to-strip adapters are approximated by series of function in given frequency range.