Test results of an improved short-baseline digital deformometer using a new bench design

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Дәйексөз келтіру

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Рұқсат жабық Рұқсат берілді
Рұқсат жабық Рұқсат ақылы немесе тек жазылушылар үшін

Аннотация

The article presents the results on laboratory tests of a short-baseline digital deformometer (SDC), developed to study deformation processes on pipelines and units of engineering structures, with the changes made to its design and electronic part, as well as the results of testing a new design of the test bench. The presented results show the effectiveness and accuracy of the new testing methodology, which makes it possible to increase the reliability of the results obtained.

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Авторлар туралы

A. Manukin

Sergeev Institute of Environmental Geoscience, Russian Academy of Sciences; Institute of Earth Physics, Russian Academy of Sciences

Email: gimaal@yandex.ru
Ресей, Ulanskii per., 13, str. 2, Moscow, 101000; ul. B. Gruzinskaya, 10, Moscow, 123242

V. Timkov

Sergeev Institute of Environmental Geoscience, Russian Academy of Sciences

Email: gimaal@yandex.ru
Ресей, Ulanskii per., 13, str. 2, Moscow, 101000

V. Savosin

Institute of Earth Physics, Russian Academy of Sciences

Email: gimaal@yandex.ru
Ресей, ul. B. Gruzinskaya, 10, Moscow, 123242

M. Ginzburg

Sergeev Institute of Environmental Geoscience, Russian Academy of Sciences

Хат алмасуға жауапты Автор.
Email: gimaal@yandex.ru
Ресей, Ulanskii per., 13, str. 2, Moscow, 101000

Әдебиет тізімі

  1. Manukin, A.B., Ginzburg, A.A., Savosin, V.V., Ginzburg, M.A. [Short-base high-sensitivity digital deformometer for measuring deformations on pipelines and units of engineering structures]. Geoekologiya, 2022, no. 1, pp. 77–84. (in Russian)

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Әрекет
1. JATS XML
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2. Fig. 1. Previous sample of DCC [1].

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3. Fig. 2. Improved version of the DCS. 1 – Measuring bracket, 2 – fixed plates, 3 – capacitive transducer board, 4 – controller board.

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4. Fig. 3. Test bench DKTs Plate: a – without load, b – with load of 4 kg, c – with load of 16 kg.

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5. Fig. 4. Graph of the substrate plate deformation value versus the load weight. The abscissa axis is the number of measurements during the experiment, the ordinate axis is the values ​​of relative changes in the measured differential capacitance according to the readings from the AD7745 microcircuit, i.e. the substrate plate deformation values ​​in conventional ADC units when the load changes from 0 kg (without load) to 16 kg in 4 kg increments and back to 0 kg.

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6. Fig. 5. Graphs of changes in average temperature values ​​(row 1) and plate deformations (row 2) over time. The abscissa axis is loading/unloading stages.

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7. Fig. 6. Graph of changes in average values ​​of substrate plate deformations taking into account temperature variations.

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