A method for studying the mutual orientation of plate surfaces made of optically transparent materials

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Abstract

This paper describes a device for express measurement of plate tilt angles and angles between faces of plates transparent in the visible range in the visible radiation range. The range of values of angles, which can be measured by this setup, is calculated. Measurements and calculations of reflection coefficients of samples from silicon, sapphire, quartz and polymethyl methacrylate, the surfaces of which have different roughness, allowed us to formulate a restriction on the quality of the surface under study: the rms roughness should not exceed 50 nm.

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About the authors

G. Kh. Sultanova

Federal State Budgetary Scientific Institution Technological Institute for Superhard and New Carbon Materials; Federal State Autonomous Educational Institution of Higher Education “Moscow Institute of Physics and Technology (National Research University)”

Email: useinov@mail.ru
ORCID iD: 0000-0002-4770-5724

Junior Researcher

Russian Federation, Troitsk; Dolgoprudny

A. A. Prakash

Federal State Budgetary Scientific Institution Technological Institute for Superhard and New Carbon Materials; Federal State Autonomous Educational Institution of Higher Education “Moscow Institute of Physics and Technology (National Research University)”

Email: useinov@mail.ru
ORCID iD: 0009-0003-8615-7972

Researcher Trainee

Russian Federation, Troitsk; Dolgoprudny

E. V. Gladkikh

Federal State Budgetary Scientific Institution Technological Institute for Superhard and New Carbon Materials

Email: useinov@mail.ru
ORCID iD: 0000-0001-8273-3934

Cand. of Sci. (Physics and Mathematics), Researcher

Russian Federation, Troitsk

A. A. Rusakov

Federal State Budgetary Scientific Institution Technological Institute for Superhard and New Carbon Materials

Email: useinov@mail.ru
ORCID iD: 0000-0001-5702-1353

Junior Researcher

Russian Federation, Troitsk

N. V. Kornilov

Federal State Budgetary Scientific Institution Technological Institute for Superhard and New Carbon Materials

Email: useinov@mail.ru
ORCID iD: 0000-0001-6449-4562

Cand. of Sci. (Physics and Mathematics), Leading Researcher

Russian Federation, Troitsk

A. S. Useinov

Federal State Budgetary Scientific Institution Technological Institute for Superhard and New Carbon Materials

Author for correspondence.
Email: useinov@mail.ru
ORCID iD: 0000-0002-9937-0954

Cand. of Sci. (Physics and Mathematics), Deputy Director

Russian Federation, Troitsk

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Supplementary files

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2. Fig.1. Installation scheme

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3. Fig.2. Dependence of the distance between the reflexes on the screen of the installation on the refractive index of the sample at the thickness of the sample d = 10 mm

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4. Fig.3. Dependence of the reflex shift on the sample tilt angle

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5. Fig.4. Dependence of the angle between the faces of samples with different refractive indices on the magnitude of the reflex shift

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Copyright (c) 2024 Sultanova G.K., Prakash A.A., Gladkikh E.V., Rusakov A.A., Kornilov N.V., Useinov A.S.

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