Force curves in scanning probe microscopy
- Authors: Akhmetova A.I.1,2, Dubrovin E.V.1, Yaminsky I.V.1,2
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Affiliations:
- Lomonosov Moscow State University
- Advanced Technologies Center
- Issue: Vol 18, No 3-4 (2025)
- Pages: 204-210
- Section: Nanotechnologies
- URL: https://journals.eco-vector.com/1993-8578/article/view/684392
- DOI: https://doi.org/10.22184/1993-8578.2025.18.3-4.204.210
- ID: 684392
Cite item
Abstract
Force curves in atomic force microscopy (AFM) display the interaction between a cantilever and a sample. These curves are essential for understanding various material properties and interactions at the nanoscale, for studying elasticity, stiffness, and adhesive properties of biological samples. Force curves are used to study molecular interactions such as bond breaking and polymer stretching. Force mapping or volumetric maps of the distribution of force curves help reconstruct the spatial distribution of mechanical properties.
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About the authors
A. I. Akhmetova
Lomonosov Moscow State University; Advanced Technologies Center
Email: yaminsky@nanoscopy.ru
ORCID iD: 0000-0002-5115-8030
Cand. of Sci. (Physics and Mathematics), Senior Researcher, Leading Specialist
Russian Federation, Moscow; MoscowE. V. Dubrovin
Lomonosov Moscow State University
Email: yaminsky@nanoscopy.ru
ORCID iD: 0000-0001-8883-5966
Doct. of Sci. (Physics and Mathematics), Leading Researcher
Russian Federation, MoscowI. V. Yaminsky
Lomonosov Moscow State University; Advanced Technologies Center
Author for correspondence.
Email: yaminsky@nanoscopy.ru
ORCID iD: 0000-0001-8731-3947
Doct. of Sci. (Physics and Mathematics), Prof., Director
Russian Federation, Moscow; MoscowReferences
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