Study of micro-scale surface deformations based on atomic force microscopy data analysis using the digital image correlation method

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Abstract

The applicability of the digital image correlation (DIC) method to atomic force microscopy (AFM) topographies under local loading is demonstrated. Technically pure Grade 4 titanium after equal-channel angular pressing according to the Conform scheme was investigated. Local deformation was formed by a microspherical diamond indenter (R = 2.5 μm). AFM scanning of the pre-/post-indentation region was performed with registration using a square scratch pattern (~1 µm). Pre-processing included artifact suppression and field equalization. Subpixel DIC over local windows provided recovery of the radial and tangential components of the displacement field. Continuous maps were obtained, capturing the propagation of disturbances beyond the contact zone and the features of local plastic deformation. The results confirm the technical feasibility and informativeness of DIC for quantitative mapping of displacements during nanoindentation of ultrafine-grained titanium.

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About the authors

A. P. Fedotkin

Federal State Autonomous Educational Institution of Higher Education "Moscow Institute of Physics and Technology (National Research University)"

Email: useinov@mail.ru
ORCID iD: 0000-0003-3822-4811

Engineer

Russian Federation, Dolgoprudny

I. V. Laktionov

Federal State Autonomous Educational Institution of Higher Education "Moscow Institute of Physics and Technology (National Research University)"

Email: useinov@mail.ru
ORCID iD: 0000-0002-8576-3669

Engineer

Russian Federation, Dolgoprudny

G. Kh. Sultanova

Federal State Autonomous Educational Institution of Higher Education "Moscow Institute of Physics and Technology (National Research University)"; National Research Center "Kurchatov Institute"

Email: useinov@mail.ru
ORCID iD: 0000-0002-4770-5724

Engineer

Russian Federation, Dolgoprudny; Moscow

K. S. Kravchuk

National Research Center "Kurchatov Institute"

Email: useinov@mail.ru
ORCID iD: 0000-0002-9956-9939

Cand. of Sci. (Physics and Mathematics), Researcher

Russian Federation, Moscow

V. N. Reshetov

Federal State Autonomous Educational Institution of Higher Education "National Research Nuclear University MEPhI"

Email: useinov@mail.ru
ORCID iD: 0000-0002-8426-5991

Doct. of Sci. (Physics and Mathematics), Prof.

Russian Federation, Moscow

A. S. Useinov

Federal State Institution of Science Institute for High Pressure Physics of the Russian Academy of Sciences

Author for correspondence.
Email: useinov@mail.ru
ORCID iD: 0000-0002-9937-0954

Cand. of Sci. (Physics and Mathematics), Deputy Director

Russian Federation, Troitsk, Moscow

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Supplementary files

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2. Fig.1. AFM image of the surface before (a) and after (b) imprinting

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3. Fig.2. Radial (a) and tangential (b) displacements map

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Copyright (c) 2025 Fedotkin A.P., Laktionov I.V., Sultanova G.K., Kravchuk K.S., Reshetov V.N., Useinov A.S.