Development of a method for accelerated quality control of electrochromic devices

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Abstract

This article presents a method for non-destructive quality control of architectural electrochromic devices capable of regulating light and heat flows in residential premises. A distinctive feature of these devices is their high thermal efficiency, which is 80% higher than that of conventional double-glazed windows. However, the issue of quality control of electrochromic devices, which was previously based on long-term cyclic tests, has remained unresolved. The result of the study was a new method that allows reducing the diagnostic time of electrochromic products from several weeks to 40-50 minutes.

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About the authors

Sergei Olegovich Lebedev

Saint Petersburg State Institute of Technology (Technical University)

Author for correspondence.
Email: ya.lebedas@yandex.ru
ORCID iD: 0009-0000-6555-8054

assistant, Department of Automation of Chemical Industry Processes

Russian Federation, Saint Petersburg

Leon Abramovich Rusinov

Saint Petersburg State Institute of Technology (Technical University)

Email: ya.lebedas@yandex.ru

Head of the Department of Automation of Chemical Industry Processes, Doctor of Technical Sciences, Professor

Russian Federation, Saint Petersburg

Vladislav Valerievich Kravchenko

JSC Octoglass

Email: ya.lebedas@yandex.ru

General Director 

Russian Federation, Moscow

Dmitry Pavlovich Knyazhev

JSC Octoglass

Email: ya.lebedas@yandex.ru

technical director 

Russian Federation, Moscow

Ksenia Sergeevna Novikova

JSC Octoglass

Email: ya.lebedas@yandex.ru

Chief Technologist

Russian Federation, Moscow

Dmitry Dmitrievich Bernt

JSC Octoglass

Email: ya.lebedas@yandex.ru

consultant

Russian Federation, Moscow

References

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  3. Makaryan I. A., Grachev V. P., Aldoshin S. M. On the prospects for developing new energy-saving devices based on “smart” glass. Nanotekhnologii dlya al’ternativnoj energetici = Nanotechnology for alternative energy. 2012;11(79):98–112.
  4. Lebedev S. O., Borodzyulya V. F. Effect of electrical forming of electrochromic devices based on tungsten oxide. Optichesky zhurnal = Optical journal. 2021;12:93–100.
  5. Shchegolkov A. V., Tugolukov E. N. Overview of electrochromic materials and devices: Scope and development prospects. Advanced Materials & Technologies. 2020;2(18):66–73.
  6. Belousov A. L., Patrusheva T. N. Electrochromic oxide materials. Zhurnal Sibirskogo federal’nogo universiteta = Journal of the Siberian Federal University. 2014;7:698–710.
  7. Khubolov B. M. Physicochemical properties of electrochromic complex tungsten oxides. Fiziko-himicheskie aspekty klasterov, nanosturktur i nanomaterialov = Physicochemical aspects of clusters, nanostructures and nanomaterials. 2021;13:421–429.
  8. GOST R 56759-2015. Composites. Method for assessing the cyclic stability of the current voltage at room temperature of absorbing electrochromic coatings of sealed glass units. Moscow: Standartinform, 2016. 24 p.
  9. Kiriyenko D. A. Switching and electrochromic effect in nano- and microstructures based on transition metal oxides. 01.04.04 Physical Electronics: dissertation for the degree of candidate of physical and mathematical sciences. Petrozavodsk. 2013. 121 p.

Supplementary files

Supplementary Files
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2. Fig. 1. Structure of the ECU

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3. Fig. 2. Dependence of peak intensity on the diffraction angle (X-ray diffraction spectrum) of amorphous hydrogel WO3 nH2O2 mH2O

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4. Fig. 3. Example of dependence of electrochromic losses of the EHU series on the specific electric charge. Q is the specific charge, D is the optical density

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5. Fig. 4. Dependence of the initial loss parameter on the annealing temperature during the manufacture of the EHU series for three temperature rise rates during annealing

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6. Fig. 5. Dependence of the thickness of the electrochromic material on the annealing temperature during the manufacture of the EHU series for three rates of temperature rise during annealing

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7. Fig. 6. Temperature dependence of the difference in temperature (DTA) (differential thermal analysis) for ECM based on tungsten trioxide (WO3)

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8. Fig. 7. Dependence of the service life (in cycles) on the annealing temperature during the manufacture of the EHU series for three rates of temperature increase during annealing

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9. Fig. 8. Dependence of the operational reliability parameter N on the annealing temperature during the manufacture of the EHU series for three rates of temperature rise during annealing

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Copyright (c) 2025 Lebedev S.O., Rusinov L.A., Kravchenko V.V., Knyazhev D.P., Novikova K.S., Bernt D.D.