Development of a wide-field scanner-profilometer and new methods of hardness measurement for the first Earth satellite atomic force microscope in the world

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Abstract

A new design of scanner for atomic force microscope-satellite is proposed and worked out. The scanner is intended to work for several years in autonomous mode in open space to study orbits for the content of micro- and nanoparticles of dust and is based on profilometer as one of the scanning axes. The microscope equipped this scanner is designed and tested for resistance to overloads up to 50g at launch, power consumption of no more than 1 W from solar batteries, resistant to streams of fast solar plasma ions, has a large scanning field of the open-to-space mirror for detection and study of particles falling on it even if their number is small. It is shown that the inductive sensor with linear drive used in profilometers with a linear drive of several tens of millimeters can be upgraded to a resolution of 1 nm, both in relief heights by reducing the magnetic gap and laterally by using ultra-sharp diamond needles with a tip of several atoms at the end. The use of a second linear actuator for the second coordinate provides line-by-line scanning of large areas with nanometre accuracy and with the number of dots up to 10 Gigapixels, while scanning one frame in a few days is quite acceptable for a space experiment lasting several years in autonomous mode. New methods of measuring hardness of bulk materials and thin films, which have a number of fundamental advantages and do not require any other devices in presence of profilometers or probe microscopes, have been developed when selecting the microscope mirror material. Mock-ups of the main units of the new scanner were manufactured and tested, which showed its performance in principle and made it possible to start patenting and manufacturing of the flight version of the autonomous space atomic force microscope, which claims to be "the first in the world".

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About the authors

B. A. Loginov

National Research University of Electronic Technology MIET; Educational Centre "Sirius"; Sirius Federal Territory

Author for correspondence.
Email: b-loginov@mail.ru
ORCID iD: 0000-0001-5081-1424

Head of Laboratory, Head of Project

Russian Federation, Zelenograd; JSC PROTON Plant; Zelenograd

V. A. Bespalov

National Research University of Electronic Technology MIET

Email: b-loginov@mail.ru
ORCID iD: 0000-0003-4976-8515

Corr. Member of RAN, Doct. of Sci (Tech), Rector

Russian Federation, Zelenograd

A. N. Obraztsov

Lomonosov Moscow State University, Physical department

Email: b-loginov@mail.ru
ORCID iD: 0000-0001-8017-0496

Doct. of Sci (Physics and Mathematics), prof.

 

Russian Federation, Moscow

A. B. Loginov

National Research University of Electronic Technology MIET; Lomonosov Moscow State University, Physical department; JSC PROTON Plant

Email: b-loginov@mail.ru
ORCID iD: 0000-0003-2090-5301

Postgraduate

Russian Federation, Zelenograd; Moscow; Zelenograd

V. B. Loginov

National Research University of Electronic Technology MIET; JSC PROTON Plant

Email: b-loginov@mail.ru
ORCID iD: 0000-0002-2116-7411

Leading Designer

Russian Federation, Zelenograd; Zelenograd

Yu. V. Khripunov

Educational Centre "Sirius"; Orel State University named after I.S. Turgenev

Email: b-loginov@mail.ru
ORCID iD: 0000-0003-2250-0420

Cand. of Sci. (Physics and Mathematics), Docent

Russian Federation, Sirius Federal Territory; Orel

M. A. Shcherbina

Educational Centre "Sirius"; Orel State University named after I.S. Turgenev

Email: b-loginov@mail.ru
ORCID iD: 0009-0001-8873-4986

Student

Russian Federation, Sirius Federal Territory; Orel

D. A. Sevostyanova

Educational Centre "Sirius"

Email: b-loginov@mail.ru
ORCID iD: 0009-0005-0496-6755

Trainee

Russian Federation, Sirius Federal Territory

D. S. Bogdanova

Educational Centre "Sirius"

Email: b-loginov@mail.ru
ORCID iD: 0009-0002-7532-4678

Student

Russian Federation, Sirius Federal Territory

R. G. Gorbachev

Educational Centre "Sirius"

Email: b-loginov@mail.ru
ORCID iD: 0009-0007-0435-6847

Student

Russian Federation, Sirius Federal Territory

K. E. Kondratyeva

Educational Centre "Sirius"

Email: b-loginov@mail.ru
ORCID iD: 0009-0009-9965-7750

Student

Russian Federation, Sirius Federal Territory

M. A. Lebedeva

Educational Centre "Sirius"

Email: b-loginov@mail.ru
ORCID iD: 0009-0001-9070-3505

Student

Russian Federation, Sirius Federal Territory

A. A. Mulgin

Educational Centre "Sirius"

Email: b-loginov@mail.ru
ORCID iD: 0009-0005-7847-7137

Student

Russian Federation, Sirius Federal Territory

D. A. Shevchenko

Educational Centre "Sirius"

Email: b-loginov@mail.ru
ORCID iD: 0009-0009-8866-0268

студент

 

Russian Federation, Sirius Federal Territory

References

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  2. Логинов Б.А. Комплекс зондовой микроскопии для работы в космическом пространстве и атмосфере. Патент на изобретение 2778278 C1, 17.08.2022, Заявка № 2021128836 от 04.10.2021.
  3. Логинов Б.А. Первый в мире сканирующий зондовый микроскоп в виде спутника как старт этапа научных спутников-лабораторий. НАНОИНДУСТРИЯ. 2021. № 5. С. 22–26. https://doi.org/ 10.22184/1993-8578.2021.14.5.270.274
  4. Логинов Б.А., Хрипунов Ю.В., Щербина М.А., Вьюник А.О., Дмитриева В.Д., Дьякова А.А., Лебедева М.К., Макеев В.С., Первых А.Р., Шевченко Д.С., Ханин С.Д. Наблюдение изменения морфологии пленок высокотемпературных металлов в сканирующем зондовом микроскопе при прогреве в условиях открытого космоса. НАНОИНДУСТРИЯ. 2024. № 2. С. 90–97. https://doi.org/10.22184/1993-8578.2024.17.2.90.9
  5. Логинов Б.А., Логинов П.Б., Логинов В.Б., Логинов А.Б. Зондовая микроскопия: применения и рекомендации по разработке. НАНОИНДУСТРИЯ. 2019. № 6. C. 352–365. https://doi.org/10.22184/1993-8578.2019.12.6.366.369
  6. Левин К.Л., Беспалова Е.А., Ванькаев А.С., Клюкина Е.В., Лопатин А.В., Метальников Н.М., Сапрыкин М.Э., Логинов А.Б., Оразов И.В., Логинов Б.А. Изучение изменения морфологии поверхности многослойных графеновых структур при воздействии плазмой в качестве модели солнечного ветра в открытом космосе // Международный журнал прикладных и фундаментальных исследований. 2021. № 9. С. 51–55.
  7. Елкин А.Г., Логинов Б.А., Логинов В.Б., Троян В.И. Устройство прецизионного перемещения. Патент на изобретение RU 2537363 C2, 10.01.2015, Заявка № 2013107665/11 от 21.02.2013.

Supplementary files

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2. Fig.1. Images of needle examination in "Scanning Electron Microscope REM-10" before and after plasma exposure: a – destroyed silicon cantilever needle after plasma exposure; b – non-destroyed diamond needle after plasma exposure; c – diamond needle before plasma exposure

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3. Fig.2. Inductive sensor of "Profilometer model 130 – KOSMOS": a – sensor scheme; b – made model; c – taken graph of dependence of sensor sensitivity (change of output signal when the needle is raised by 0.5 mm) on the magnetic gap

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4. Fig.3. Manufactured models: a – model of vibration test "Sirius-BB24"; b – model of wide-field microscope scanner with a component part in the form of "Profilometer model 130 – KOSMOS"; c – frame of the notch section obtained on the model of wide-field scanner with automatic assembly of the frame with the help of the written software from the profiles taken by the profilometer

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5. Fig.4. The Grand Challenges-2024 Programme Team that assembled and tested models of the world’s first Earth satellite atomic force microscope, from left to right: Andrey Mulgin, Maxim Shcherbina, Daria Bogdanova, Yuri Khripunov, Ksenia Kondratyeva, Daria Shevchenko, Maria Lebedeva, Alexander Obraztsov, Daria Sevostyanova, Boris Loginov, Roman Gorbachev

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6. Fig.5. The work of the Grand Challenges-2024 team in the G.N.Flerov auditorium No. 108 in the round building "School" of the Sirius Educational Centre campus in Sochi: a – production of a model of the new satellite "Nanozond-A" on a scale of 1:1; b – process of plasma impact on diamond and silicon needles in the "MAG-5 vacuum-plasma unit"; c – taking frames on the "SMM-2000 scanning probe microscope"; d – selection of the longest of the ultra-sharp diamond needles from the MSU Physical Department in the optical microscope for its use in the world’s first space atomic force microscope "SMM-2000-ALMAZ"

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7. Fig.6. Layout for diamond scratch hardness measurement: a – schematic; b – photograph; c – profile taken on a "Profilometer Model 130" with the scratch groove width of 97.72 µm determined by the distance between the intersection of the groove profile with a blue line placed at the level of the surface outside the groove

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8. Fig.7. Layout for measuring hardness by scratching with emery cloth and frames taken with "Scanning Probe Microscope SMM-2000": a – scheme showing that for uniform pressure a piece of sandpaper, according to the blue colour drawing, is attached through an elastic support; b – view of the layout; c – frame of "7000" sandpaper with an average grain size of about 3 microns; d – atomic force microscopy frame of the surface of a gold mirror after 5 cycles of passing with this skin, the total height spread on this 4.3 × 4.3 µm frame is 277 nm; e – scanning tunnelling microscopy frame of the surface of a 90 nm thick chromium film on quartz glass after 20 cycles of passing with this sandpaper

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Copyright (c) 2024 Loginov B.A., Bespalov V.A., Obraztsov A.N., Loginov A.B., Loginov V.B., Khripunov Y.V., Shcherbina M.A., Sevostyanova D.A., Bogdanova D.S., Gorbachev R.G., Kondratyeva K.E., Lebedeva M.A., Mulgin A.A., Shevchenko D.A.

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