Stability of properties and degradation mechanisms of multilayer transparent conductive structures during their "Damp heat" testing

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Abstract

The sheet resistance stability and optical transparence of three-layer structures ITO/Ag/ITO, GZO/Al/GZO, as well as thin-film periodic structure IZO with thickness-modulated oxygen content was studied during 1000-hour tests under conditions of 85% humidity and 85 °C temperature. The analysis of the degradation mechanisms of the structures depending on composition and properties of individual layers was performed.

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About the authors

A. K. Abduev

Federal State University of Education

Author for correspondence.
Email: a_abduev@mail.ru
ORCID iD: 0000-0002-3948-1206

Cand. of Sci. (Physics and Mathematics), Docent

Russian Federation, Moscow

A. K. Akhmedov

Institute of physics, Dagestan Research Center of RAS

Email: a_abduev@mail.ru
ORCID iD: 0000-0002-9466-9842

Cand. of Sci. (Physics and Mathematics), Leading Researcher

Russian Federation, Makhachkala

E. K. Murliev

Institute of physics, Dagestan Research Center of RAS

Email: a_abduev@mail.ru
ORCID iD: 0009-0009-7742-8527

Junior Researcher

Russian Federation, Makhachkala

A. S. Asvarov

Institute of physics, Dagestan Research Center of RAS

Email: a_abduev@mail.ru
ORCID iD: 0000-0001-6426-5006

Cand. of Sci. (Physics and Mathematics), Leading Researcher

Russian Federation, Makhachkala

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Supplementary files

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2. Fig.1. Photos of tested structures before (top line) and after 1000 hours of damp-heat testing (bottom

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3. Fig.2. TEM micrographs of cross sections (a, b, c) and oxygen distribution maps (a1, b1, c1) for multilayer structures ITO/Ag/ITO (a и a1), GZO/Al/GZO (b и b1) and periodic structure IZO (c и c1) correspondently

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Copyright (c) 2024 Abduev A.K., Akhmedov A.K., Murliev E.K., Asvarov A.S.