Nanoindustry
ISSN 1993-8578 (Print)
ISSN 2687-0282 (Online)
Menu
Archives
Home
About the Journal
Editorial Team
Editorial Policies
Author Guidelines
About the Journal
Issues
Search
Current
Retracted articles
Archives
Contact
Subscriptions
All Journals
User
Username
Password
Remember me
Forgot password?
Register
Notifications
View
Subscribe
Subscription
Login to verify subscription
Search
Search
Search Scope
All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
By Sections
Other Journals
Categories
Keywords
Fourier filtering
atomic force microscopy
biomechanics
bionanoscopy
biosynthesis
chemical deposition
colloidal photonic crystal structures
data processing
hardness
microorganisms
nanoengineering
nanoparticles
nanotechnologies
nature-like technologies
photonics
recovery
scanning capillary microscopy
scanning probe microscopy
scanning tunnelling microscopy
substrate alignment
superlattices
×
User
Username
Password
Remember me
Forgot password?
Register
Notifications
View
Subscribe
Subscription
Login to verify subscription
Search
Search
Search Scope
All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
By Sections
Other Journals
Categories
Keywords
Fourier filtering
atomic force microscopy
biomechanics
bionanoscopy
biosynthesis
chemical deposition
colloidal photonic crystal structures
data processing
hardness
microorganisms
nanoengineering
nanoparticles
nanotechnologies
nature-like technologies
photonics
recovery
scanning capillary microscopy
scanning probe microscopy
scanning tunnelling microscopy
substrate alignment
superlattices
Home
>
Search
>
Author Details
Author Details
Shcherbina, M. A.
Issue
Section
Title
File
Vol 17, No 1 (2024)
Nanotechnologies
Study of thermoemission sputtering method for preparing thin-film metal coatings for open space scanning tunnel microscope operation
Vol 17, No 3-4 (2024)
Equipment for Nanoindustry
Development of a method for updating the probe of a scanning probe microscope in open space conditions
Vol 17, No 5 (2024)
Equipment for Nanoindustry
Development of a wide-field scanner-profilometer and new methods of hardness measurement for the first Earth satellite atomic force microscope in the world
This website uses cookies
You consent to our cookies if you continue to use our website.
About Cookies
TOP