Russian Microelectronics
ISSN 0544-1269 (Print)
ISSN 3034-5480 (Online)
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MEMS switch
bipolar transistor
etching
fluorine atoms
fluorocarbon gases
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
powerful LDMOS
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
spiking neural networks
testing
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All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
By Sections
Other Journals
Categories
Keywords
MEMS switch
bipolar transistor
etching
fluorine atoms
fluorocarbon gases
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
powerful LDMOS
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
spiking neural networks
testing
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