Russian Microelectronics
ISSN 0544-1269 (Print)
ISSN 3034-5480 (Online)
Menu
Archives
Home
About the Journal
Editorial Team
Editorial Policies
Author Guidelines
About the Journal
Issues
Search
Current
Retracted articles
Archives
Contact
Subscriptions
All Journals
Pay with
User
Username
Password
Remember me
Forgot password?
Register
Notifications
View
Subscribe
Subscription
Login to verify subscription
Your IP address:
18.97.14.90
Search
Search
Search Scope
All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
By Sections
Other Journals
Categories
Keywords
MEMS switch
bipolar transistor
etching
fluorine atoms
fluorocarbon gases
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
powerful LDMOS
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
spiking neural networks
testing
×
Pay with
User
Username
Password
Remember me
Forgot password?
Register
Notifications
View
Subscribe
Subscription
Login to verify subscription
Your IP address:
18.97.14.90
Search
Search
Search Scope
All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
By Sections
Other Journals
Categories
Keywords
MEMS switch
bipolar transistor
etching
fluorine atoms
fluorocarbon gases
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
powerful LDMOS
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
spiking neural networks
testing
Home
>
Retracted articles
Retracted articles
TOP