Elektronika: Nauka, Tekhnologiya, Biznes
ISSN 1992-4178 (Print)
ISSN 1992-4186 (Online)
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artificial intelligence
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electromagnetic compatibility
electromagnetic interference
electronic components
frequency range
import substitution
information and measurement system
insertion loss
interface
metal-ceramic package
power
printed circuit boards
production
reliability
robotics
roundness tester
shape defects
testing
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Ковалев, В.
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No 2 (2023)
Micro and nanostructures
Characteristics of silicon cantilevers for atomic force microscopy from Angstrem JSC
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