Methods for measuring S-parameters of high-speed connectors using vector network analyzers

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Abstract

The article considers the methods for measuring the s-parameters of connectors used as part of backplanes using vector network analyzers (VNA). The measurement results are presented.

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About the authors

A. Krylov

ООО «Планар-Проект»

Author for correspondence.
Email: journal@electronics.ru
Russian Federation, Москва

F. Krekoten

ООО «Совтест Микро»

Email: journal@electronics.ru
Russian Federation, Зеленоград

A. Pankov

ООО «Совтест Микро»

Email: journal@electronics.ru
Russian Federation, Зеленоград

References

  1. Программное обеспечение для автоматического исключения оснастки. Руководство по эксплуатации. // https://planarchel.ru URL: https://planarchel.ru/upload/uf/810/s45a5qsvsvzh5o0yus049ou4o80n2bq2/AFR_rus_ver_23.1.pdf
  2. Анализаторы цепей векторные. Руководство по эксплуатации. Программное обеспечение. // https://planarchel.ru URL: https://planarchel.ru/upload/medialibrary/9ce/hl13hjzb7hleoxc06te2he0h1c9wo4xy/Part2_S2VNA_ver_23.2.pdf
  3. Калибровка векторных анализаторов цепей перемычкой с неизвестными параметрами. // https://planarchel.ru URL: https://planarchel.ru/upload/iblock/858/d9i51w8x50gae4rfb1pugn6udhjtkyu5/Калибровка%20ВАЦ%20перемычкой%20с%20неизвестными%20параметрами.pdf

Supplementary files

Supplementary Files
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1. JATS XML
2. Fig. 1. Calibration board manufactured by Sovtest Micro Ltd.

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3. Fig. 2. Measuring tooling of Sovtest Micro LLC, top view.

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4. Fig. 3. Measuring tooling of Sovtest Micro LLC, bottom view.

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5. Fig. 4. Design of printed circuit board layers

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6. Fig. 5. Iterative selection of conductor width

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7. Fig. 6. Parametric model of the transition hole, dielectric layers are not shown

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8. Fig. 7. Installation location of the SMA coaxial connector

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9. Fig. 8. Measuring stand based on VAC C4220 manufactured by PLANAR Ltd.

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10. Fig. 9. Measurement results of the XX measure.

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11. Fig. 10. Measurement results of the short-circuit measure.

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12. Fig. 11. Characteristics and repeatability of coaxial connectors.

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13. Fig. 12. Frequency characteristics of |S11| measure XX.

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14. Fig. 13. Calibration reference plane offset result for measure XX.

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15. Fig. 14. Characteristics of |S11| measure XX in the time domain.

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16. Fig. 15. Characteristics of |S11| measure XX based on the loss compensation results.

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17. Fig. 16. Frequency response of S11 of the short-circuit measure before characterization.

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18. Fig. 17. Characteristics of |S11| short-circuit measure based on the results of reference plane displacement, coaxial coupler reflection elimination and feedline loss compensation.

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19. Fig. 18. Phase-frequency characteristics of the measures after characterization.

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20. Fig. 19. Frequency response |S11| of the CH measure before the characterization was performed

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21. Fig. 20. Characteristics |S11| of the CH measure based on the results of reference plane displacement, coaxial coupler reflection elimination, and feedline loss compensation.

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22. Fig. 21. Description of a set of calibration measures based on characterization results

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23. Fig. 22. Description of the scheme of connection of the measuring tooling to the device being measured, indicating the method used for calculating the tooling parameters in the AFR software.

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24. Fig. 23. Results of tooling characterization in AFR software

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25. Fig. 24. Impedance profile of the measuring tool according to the results of characterization in AFR software

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26. Fig. 25. S-parameters of a pair of mating connectors.

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27. Fig. 26. |S21| mating connectors for six pairs of contacts according to the topology of the measuring tooling

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28. Fig. 27. |S11| mating connectors for six pairs of contacts according to the topology of the measuring tooling

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Copyright (c) 2023 Krylov A., Krekoten F., Pankov A.

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