Enviar artigo por via de e-mail Methods for measuring S-parameters of high-speed connectors using vector network analyzers
- Autores: Krylov A.1, Krekoten F.2, Pankov A.2
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Afiliações:
- ООО «Планар-Проект»
- ООО «Совтест Микро»
- Edição: Nº 8 (229) (2023)
- Páginas: 42-54
- Seção: Test and measurement
- URL: https://journals.eco-vector.com/1992-4178/article/view/632319
- DOI: https://doi.org/10.22184/1992-4178.2023.229.8.42.54
- ID: 632319
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Resumo
The article considers the methods for measuring the s-parameters of connectors used as part of backplanes using vector network analyzers (VNA). The measurement results are presented.
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Sobre autores
A. Krylov
ООО «Планар-Проект»
Autor responsável pela correspondência
Email: journal@electronics.ru
Rússia, Москва
F. Krekoten
ООО «Совтест Микро»
Email: journal@electronics.ru
Rússia, Зеленоград
A. Pankov
ООО «Совтест Микро»
Email: journal@electronics.ru
Rússia, Зеленоград
Bibliografia
- Программное обеспечение для автоматического исключения оснастки. Руководство по эксплуатации. // https://planarchel.ru URL: https://planarchel.ru/upload/uf/810/s45a5qsvsvzh5o0yus049ou4o80n2bq2/AFR_rus_ver_23.1.pdf
- Анализаторы цепей векторные. Руководство по эксплуатации. Программное обеспечение. // https://planarchel.ru URL: https://planarchel.ru/upload/medialibrary/9ce/hl13hjzb7hleoxc06te2he0h1c9wo4xy/Part2_S2VNA_ver_23.2.pdf
- Калибровка векторных анализаторов цепей перемычкой с неизвестными параметрами. // https://planarchel.ru URL: https://planarchel.ru/upload/iblock/858/d9i51w8x50gae4rfb1pugn6udhjtkyu5/Калибровка%20ВАЦ%20перемычкой%20с%20неизвестными%20параметрами.pdf
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Ação
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Fig. 1. Calibration board manufactured by Sovtest Micro Ltd.
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Fig. 2. Measuring tooling of Sovtest Micro LLC, top view.
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Fig. 3. Measuring tooling of Sovtest Micro LLC, bottom view.
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Fig. 4. Design of printed circuit board layers
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Fig. 5. Iterative selection of conductor width
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Fig. 6. Parametric model of the transition hole, dielectric layers are not shown
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Fig. 7. Installation location of the SMA coaxial connector
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Fig. 8. Measuring stand based on VAC C4220 manufactured by PLANAR Ltd.
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Fig. 9. Measurement results of the XX measure.
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Fig. 10. Measurement results of the short-circuit measure.
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Fig. 11. Characteristics and repeatability of coaxial connectors.
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Fig. 12. Frequency characteristics of |S11| measure XX.
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Fig. 13. Calibration reference plane offset result for measure XX.
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Fig. 14. Characteristics of |S11| measure XX in the time domain.
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Fig. 15. Characteristics of |S11| measure XX based on the loss compensation results.
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Fig. 16. Frequency response of S11 of the short-circuit measure before characterization.
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Fig. 17. Characteristics of |S11| short-circuit measure based on the results of reference plane displacement, coaxial coupler reflection elimination and feedline loss compensation.
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Fig. 18. Phase-frequency characteristics of the measures after characterization.
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Fig. 19. Frequency response |S11| of the CH measure before the characterization was performed
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Fig. 20. Characteristics |S11| of the CH measure based on the results of reference plane displacement, coaxial coupler reflection elimination, and feedline loss compensation.
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Fig. 21. Description of a set of calibration measures based on characterization results
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Fig. 22. Description of the scheme of connection of the measuring tooling to the device being measured, indicating the method used for calculating the tooling parameters in the AFR software.
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Fig. 23. Results of tooling characterization in AFR software
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Fig. 24. Impedance profile of the measuring tool according to the results of characterization in AFR software
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Fig. 25. S-parameters of a pair of mating connectors.
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Fig. 26. |S21| mating connectors for six pairs of contacts according to the topology of the measuring tooling
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Fig. 27. |S11| mating connectors for six pairs of contacts according to the topology of the measuring tooling
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