Scanning capillary microscopy for biological applications

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Abstract

Scanning capillary microscopy is an optimal tool for contactless visualization of living cells and measurement of their mechanical properties. Capillary microscopy is increasingly used to study intercellular contacts, to assess morphology under different growth conditions of cell culture, to visualize and measure the topography of tissue sections. Contactless visualization without the use of labels and fixation, the possibility of research in liquid media with high spatial resolution, and long-term experiments with living objects make capillary microscopy an important and relevant tool in modern research. Therefore, the improvement of device of a capillary microscope, its internal architecture, mechanics, electronics, and software are of particular interest.

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About the authors

A. I. Akhmetova

Lomonosov Moscow State University; Advanced Technologies Center

Email: yaminsky@nanoscopy.ru
ORCID iD: 0000-0002-5115-8030

Researcher, Leading Specialist, Lomonosov Moscow State University, Physical department

Russian Federation, Moscow; Moscow

A. D. Terentyev

Lomonosov Moscow State University; Advanced Technologies Center

Email: yaminsky@nanoscopy.ru
ORCID iD: 0009-0009-1528-5284

Master, Programmer, Lomonosov Moscow State University, Physical department

Russian Federation, Moscow; Moscow

A. I. Fedoseev

Lomonosov Moscow State University

Email: yaminsky@nanoscopy.ru
ORCID iD: 0009-0007-7282-1093

Doct. of Sci. (Physics and Mathematics), Prof., Physical department

Russian Federation, Moscow

D. I. Yaminsky

Moscow State University

Email: yaminsky@nanoscopy.ru
ORCID iD: 0009-0009-6370-7496

Post-Graduate, Physical department

Russian Federation, Moscow

I. V. Yaminsky

Lomonosov Moscow State University; Advanced Technologies Center

Author for correspondence.
Email: yaminsky@nanoscopy.ru
ORCID iD: 0000-0001-8731-3947

Doct. of Sci. (Physics and Mathematics), Prof., Director General, Lomonosov Moscow State University, Physical department

Russian Federation, Moscow; Moscow

References

  1. Song Q, Alvarez-Laviada A., Schrup S.E., Reilly-O’Donnell B., Entcheva E., Gorelik J. Opto-SICM framework combines optogenetics with scanning ion conductance microscopy for probing cell-to-cell contacts. Commun Biol. 2023. Nov 8. Vol. 6(1). PP. 1131. https://doi.org/10.1038/s42003-023-05509-3
  2. Tikhonova T.N., Kolmogorov V.S., Timoshenko R.V., Vaneev A.N., Cohen-Gerassi D., Osminkina L.A., Gorelkin P.V., Erofeev A.S., Syso¬ev N.N., Adler-Abramovich L. et al. Sensing Cells-Peptide Hydrogel Interaction In Situ via Scanning Ion Conductance Microscopy. Cells. 2022. Vol. 11(24). P. 4137. https://doi.org/10.3390/cells11244137
  3. Ushiki T., Nakajima M., Choi M., Cho S.J., Iwata F. Scanning ion conductance microscopy for imaging biological samples in liquid: A comparative study with atomic force microscopy and scanning electron microscopy. Micron 2012. Vol. 43. PP. 1390–1398.
  4. Ruan H., Zhang X., Yuan J., Fang X. Effect of water-soluble fullerenes on macrophage surface ultrastructure revealed by scanning ion conductance microscopy. RSC Ad. v. 2022. Aug 10. Vol. 12(34). PP. 22197–22201. https://doi.org/10.1039/d2ra02403a
  5. Akhmetova A.I., Yaminsky D.I., Yaminsky I.V. Femtoscan Online: Image Processing and Filtering. NANOINDUSTRY. Vol. 17. No. 3-4. 2024. PP. 178–183. https://doi.org/10.22184/1993-8578.2024.17.3-4.178.183
  6. Akhmetova A.I., Sovetnikov T.O., Zorikova E.O., Yaminsky I.V. Scanning probe microscopy of substantia nigra. NANOINDUSTRY. Vol. 17. No. 1. 2024. PP. 26–31. https://doi.org/10.22184/1993-8578.2024.17.1.26.31
  7. Akhmetova A.I., Terentyev A.D., Senotrusova S.A., Sovetnikov T.O., Yaminsky D.I., Popov V.V., Yaminsky I.V. Diffraction grating as a means of metrological support of microscopy. NANOINDUSTRY. Vol. 17. No. 2. 2024. PP. 128–133. https://doi.org/10.22184/1993-8578.2024.17.2.98.105
  8. Akhmetova A.I., Sovetnikov T.O., Loginov B.A., Yaminsky D.I., Yaminsky I.V. Quartz reference measure for scanning probe microscopy. NANOINDUSTRY. Vol. 17. No. 2. 2024. PP. 98–105. https://doi.org/10.22184/1993-8578.2024.17.2.98.105

Supplementary files

Supplementary Files
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1. JATS XML
2. Fig.1. FemtoScan X Ion placed on a Nikon Ti-U inverted optical microscope with a 40x objective lens

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3. Fig.2. Compact version of the FemtoScan X Ion scanning capillary microscope

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4. Fig.3. Mechanical system of the microscope equipped with a two-axis platform of X and Y coordinates movement

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5. Fig.4. Interface of the FemtoScan X Ion control software

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6. Fig.5. Working window of FemtoScan Online software

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Copyright (c) 2024 Akhmetova A.I., Terentyev A.D., Fedoseev A.I., Yaminsky D.I., Yaminsky I.V.