Author Details
Khripunov, Yu. V.
| Issue | Section | Title | File |
| Vol 17, No 5 (2024) | Equipment for Nanoindustry | Development of a wide-field scanner-profilometer and new methods of hardness measurement for the first Earth satellite atomic force microscope in the world | |
| Vol 18, No 2 (2025) | Equipment for Nanoindustry | Primary analysis of images from the world’s first space probe microscope "CMM-2000С" in the Earth satellite "Nanoprobe-1" | |
| Vol 18, No 5 (2025) | Equipment for Nanoindustry | Research on dust formation mechanisms in space |