Automation and calibration of a multiplex system of shape defects measurement sensors

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The article considers the possibility of replacing the contact probe of the Roundtest RA-120P roundness tester with a contactless triplex sensor. The potential automation of measurements that becomes possible as a result of this replacement is discussed.

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作者简介

K. Epifantsev

Санкт-Петербургский государственный университет аэрокосмического приборостроения

编辑信件的主要联系方式.
Email: epifancew@gmail.com

к. т. н., доцент

俄罗斯联邦

O. Kurkova

Санкт-Петербургский государственный университет аэрокосмического приборостроения

Email: redactor@electronics.ru

д.т.н., профессор

俄罗斯联邦

参考

  1. Гущина Е. А., Епифанцев К. В., Ефремов Н. Ю. Цифровая метрология: учеб.-метод. пособие. СПб: ГУАП, 2022. 104 с.
  2. Заякин О. А., Манухин А. В., Ростов А. А. Экспериментальный лазерный кругломер, исследование основной погрешности // Известия Самар. науч. центра Российской академии наук. 2017. Т. 19, № 6. С. 184–188.
  3. Епифанцев К. В. Исследование возможности применения одновиткового вихретокового датчика для измерения дефектов формы / Г. А. Петров, В. Н. Белопухов, О. А. Заякин // Инновационное приборостроение. 2024. Т. 3, № 1. С. 63–76.
  4. Spragg R.C. Accurate calibration of surface texture and roundness measuring instruments // Proc. Instr. Mech. Engrs., 1967–1968. P.32
  5. British Standard 3770:1964. Methods for the assessment of departures from roundness.
  6. Немировский А. С. Центр и направление оси несимметричных сечений и их определение по круглограмме // Измерительная техника, 1971, №11. С.22–26.
  7. Авдулов А. Н. Контроль и оценка круглости деталей машин. М.: Изд-во стандартов, 1974. С.125.

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2. 1. a – installation diagram: 1 – DM-8-650 laser, 2 – polarizer, 3 – dimmer, 4 – cylindrical lens, 5 – part, 6 – Helios lens, 7 – CCD ruler K1200TSL-1; b - the principle of import substitution of contact probes according to the author's method

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3. Fig. 2. a – photo of the installation with the laser turned on: 1 – DM-8-650 laser, 2 – polarizer, 3 – dimmer, 4 – cylindrical lens, 5 – detail, 6 – Helios lens, 7 – CCD ruler K1200TSL-1; b – prototype of the Laser String installation developments of S. I. Vavilov GOI JSC

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4. Fig. 3. Changing the shape of the waveform when micro-shifting the part

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5. Fig. 4. Graph of the dependence of the vertical deviation of the oscilloscope signal on the deviation of the part from the axis, obtained experimentally for a part made of duralumin on a laser installation.

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6. Fig. 5. Graph of the dependence of the vertical deviation of the oscilloscope signal on the deviation of the part from the axis, obtained experimentally for a steel part.

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7. Fig. 6. Graph of the dependence of the inductance on the deviation of the part from roundness, obtained experimentally for a part made of duralumin on an eddy current sensor (the part rotates in this case, the rotation of the part is counted along the circular axis, and the vertical axis is MGN)

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8. Fig. 7. Test results using a laser–type rangefinder: a – measurement of a defect in the shape of a duralumin part on a spectrum analyzer in a few seconds; b – readings of the spectrum analyzer before and after micro-displacement of the part; c - photo of the experimental setup: 1 – part on the table, 2 – rangefinder

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9. 8. The results of measuring a cylindrical part with a laser rangefinder (on the X–axis – deviations in microns, 0 – the center of the part, on the Y-axis - the amplitude of the received wave)

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10. Fig. 9. Fiber-optic circuit of the measuring path

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11. 10. a – installation diagram: 1, 4 – fiber-optic path, 2 – micrometer screw with mounted collimator, 3 – photodetector; b – installation diagram: 1 – stand with reflector, 2 – micrometer screw, 3 – collimator; c – readings of the Rohde & Schwarz oscilloscope when the micrometer 0.05 microns of the screw; d – readings of the Rohde & Schwarz oscilloscope before the displacement of the micrometer screw by 0.05 microns

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12. Fig. 11. a – a round meter with a calibration reference sample, an ICH-50 indicator connected in parallel and a capacitive probe with an electronic display; b – an enlarged view of the installation; c – readings of an electronic reader ADC on a computer

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13. Fig. 12. Calibration of the capacitive probe using a digital depth gauge

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14. Fig. 13. Kinematic diagram of the device [2]

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15. Fig. 14. Model and components of the developed multiplex system

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