Reliability and validation
Шығарылым | Атауы | Файл | |
№ 2 (233) (2024) | Methods for predicting ic durability based on parametric failures |
(Rus) |
|
Strogonov A. | |||
№ 2 (233) (2024) | Improving the reliability characteristics of multi-lead metal-ceramic packages from ZPP JSC through the use of test systems |
(Rus) |
|
Ermilov R., Shugaepov S., Ermolaev E., Egoshin V. | |||
№ 2 (233) (2024) | X-ray inspection technology |
(Rus) |
|
Aleinikov P. | |||
№ 2 (223) (2023) | TESTPRIBOR JSC test center: how to guarantee reliability |
(Rus) |
|
Shekhovtsova E. | |||
№ 7 (228) (2023) | Contacting devices and carriers from ZPP JSC for IC testing |
(Rus) |
|
Shugaepov S., Ermolaev E., Egoshin V., Magidov E. | |||
Нәтижелер 5 - 1/5 |