Informaçao sobre o Autor
Grishkevich, V.
| Edição | Seção | Título | Arquivo |
| Nº 6 (2025) | Reliability and validation | Photon emission is an innovative method for analyzing defects in microelectronics | |
| Nº 7 (2025) | Reliability and validation | Deep ultraviolet microscopy: principles and prospects of application in industry and science |