Автор туралы ақпарат
Plebanovich, V.
| Шығарылым | Бөлім | Атауы | Файл |
| № 6 (2025) | Reliability and validation | Photon emission is an innovative method for analyzing defects in microelectronics | |
| № 7 (2025) | Reliability and validation | Deep ultraviolet microscopy: principles and prospects of application in industry and science |