| Issue |
Title |
File |
| Vol 54, No 4 (2025) |
Perspectives of electron-beam and ion-beam lithography development in Russia |
 (Rus)
|
|
Zaitsev S.I., Irzhak D.V., Il’in A.I., Knyazev M.A., Roshchupkin D.V., Grachev V.P., Kurbatov V.G., Malkov G.V.
|
| Vol 54, No 6 (2025) |
STABILIZING PROCESSING OF NEGATIVE PHOTORESIST FILMS OF THE AZ nLOF20XX SERIES ON SILICON |
 (Rus)
|
|
Prosolovich V.S., Brinkevich D.I., Grinyuk E.V., Yankouski Y.N., Zubova O.A., Brinkevich S.D., Vabishchevich S.A.
|
| Vol 54, No 1 (2025) |
Investigation of double patterning method with the usage of antispacer |
 (Rus)
|
|
Tikhonova E.D., Gornev E.S.
|
| Vol 53, No 5 (2024) |
New concept for the development of high-performance X-ray lithography |
 (Rus)
|
|
Chkhalo N.I.
|
| Vol 52, No 5 (2023) |
Protective Freely Hanging Films for Projection Lithography Installations in the Extreme UV Range |
 (Rus)
|
|
Zuev S.Y., Lopatin A.Y., Luchin V.I., Salashchenko N.N., Tsybin N.N., Chkhalo N.I.
|
| Vol 52, No 2 (2023) |
Cross Sections of Scattering Processes in Electron-Beam Lithography |
 (Rus)
|
|
Rogozhin A.E., Sidorov F.A.
|
| 1 - 6 of 6 Items |
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