Study of memristor structures based on copper and tin oxides
- Authors: Permyakov D.1, Strogonov A.1
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Affiliations:
- Воронежский государственный технический университет
- Issue: No 7 (228) (2023)
- Pages: 184-190
- Section: Micro and nanostructures
- URL: https://journals.eco-vector.com/1992-4178/article/view/632116
- DOI: https://doi.org/10.22184/1992-4178.2023.228.7.184.190
- ID: 632116
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Abstract
The article describes a method for forming a memristor structure by spray pyrolysis of tin oxide and electrochemical deposition of copper oxide. The results of measuring the electrical characteristics of fabricated memristor are discussed, and the factors affecting the reproducibility of its properties are analyzed.
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About the authors
D. Permyakov
Воронежский государственный технический университет
Author for correspondence.
Email: Dima.P.S@yandex.ru
аспирант кафедры твердотельной электроники
Russian Federation, ВоронежA. Strogonov
Воронежский государственный технический университет
Email: andreistrogonov@mail.ru
профессор кафедры твердотельной электроники
Russian Federation, ВоронежReferences
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Fig. 5. HRS dependence: a - in coordinates ln(J) (ln(A / cm2)) on F (B / m); b - in coordinates ln(F / J) (ln(A ∙ cm-2 ∙ B-1 ∙ m)) on F1 / 2 (B1 / 2 / m1 / 2)) on F1 / 2 (B1 / 2 / m1 / 2))
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