Influence of design parameters on plane strain of printed circuit boards

Cover Page

Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription or Fee Access

Abstract

The article describes the development of mathematical model of plane strain of printed circuit board layers and experimental verification of its accuracy. The obtained experimental results qualitatively completely coincide with the calculation results; the quantitative discrepancy does not exceed 20%, which can be considered satisfactory at this step of clarifying the model coefficients taking into account random factors.

Full Text

Restricted Access

About the authors

S. Vantsov

МАИ (НИУ)

Author for correspondence.
Email: van2851@mail.ru

к. т. н., доцент

Russian Federation

O. Khomutskaya

МАИ (НИУ)

Email: khomutskayaov@gmail.com

к. т. н., доцент

Russian Federation

E. Liin

МАИ (НИУ)

Email: elijn@bk.ru

аспирант каф. 307

Russian Federation

References

  1. Никитин С., Поздняков К., Хомутская О. Оценка деформации печатных плат // ЭЛЕКТРОНИКА: Наука, Технология, Бизнес. 2019. № 5. С. 144–150.
  2. Куликов Н., Хомутская О., Ванцов С. Цифровой метод автоматизированной оценки деформации печатной платы // ЭЛЕКТРОНИКА: Наука, Технология, Бизнес. 2018. № 2. С. 186–191.

Supplementary files

Supplementary Files
Action
1. JATS XML
2. Fig. 1. Phase transitions during heating of thermosetting polymers. Tg - glass transition temperature; Tf - decomposition temperature; ΔL/L - relative change in linear dimensions

Download (35KB)
3. Fig. 2. Display of the hole offset direction on the printed circuit board. - start position of the hole; - end position of the hole

Download (145KB)
4. Fig. 3. Approximate view of PCB fragments: a - investigated sample; b - real board

Download (70KB)
5. Fig. 4. Hole areas

Download (42KB)
6. Fig. 5. Diagram of deformation estimation results

Download (90KB)
7. Fig. 6. Graph of dependence of M(ρ) on the thickness of the specimen

Download (63KB)

Copyright (c) 2023 Vantsov S., Khomutskaya O., Liin E.

This website uses cookies

You consent to our cookies if you continue to use our website.

About Cookies