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No 4 (225) (2023)
Competent opinion
Our customers receive the equipment not from a catalog, but exactly that they need
12-18
Event of the of the issue
Business program events of ExpoElectronica 2023. Part 1
Abstract
В текущем году Международная выставка электроники ExpoElectronica отметила свой юбилей: мероприятие проходило в 25 раз. Помимо большого количества посетителей и высокой их активности, которые можно было легко заметить на площадке, выставка этого года характеризовалась некоторыми важными изменениями. Среди них – слияние под одним брендом ExpoElectronica ранее проводившихся вместе выставок ExpoElectronica и ElectronTechExpo, а также появление нового раздела выставки – «Встраиваемые системы и конечные решения», в рамках которого, в частности, состоялся дебют специализированного Сектора Робототехники, посвященного робототехническим системам и их компонентам.
В данной статье мы остановимся на некоторых мероприятиях деловой программы выставки, которая в этом году также была очень насыщенной и включала 36 мероприятий, проводившихся как в Главном Зале и на Робо Арене, организованных на площадке самой выставки, так и в двух залах отеля «Аквариум», находящегося также на территории МВЦ «Крокус Экспо».
34-40
Exhibitions & conferences
How to correctly choose and optimally apply vector network analysers. “Fundamentals of measurement” workshop
Abstract
21 марта 2023 года в Москве состоялся семинар-практикум «Основы измерений», организованный ООО «Планар» – российским производителем контрольно-измерительного оборудования. На мероприятии рассматривались как основы проведения измерений в сфере СВЧ-электроники, так и более специализированные темы, связанные с применением векторных анализаторов цепей и подходами к автоматизации измерений.
42-43
Economy + busyness
How do we develop domestic microelectronics: 2023
Abstract
The article discusses the priority tasks facing the domestic microelectronic industry today, ways to overcome the problems that arise. Measures for import substitution of electronic components in current conditions, as well as issues of organizing the development and production of integrated circuits are considered.
46-50
Analysis of promising areas for creation an innovative business in Russian Federation
Abstract
The article presents brief description of priority areas for the development of science and technology in Russia. Based on the example of transport sector a variant of the analysis of global trends and local specifics is shown, which allows choosing a specific market segment that is currently promising for creating a domestic innovative startup.
52-57
Semiconductors: sales forecasts and development aspects
Abstract
The article presents estimates and forecasts of the development of the world semiconductor market for the period 2020-2030. General prospects for technological development are considered: further IC scaling, the use of new materials and hybrid methods for connecting IC elements, and the creation of more cost-effective chip pattern generation methods.
58-68
Manufacturing equipment and process materials
Electronic quality diamond. Innovation. Investments. Creative projects
Abstract
The article considers the electronic quality synthetic diamond as a material for development of domestic electronic components on synthetic diamond. A project for the initiation of serial production of single-crystal and polycrystalline wafers and epitaxial structures of synthetic diamond and creative projects in diamond micro-instrumentation are presented.
70-89
Electronic components
Corebai Microelectronics Chinese semiconductor developer: product overview
Abstract
Corebai Microelectronics (Beijing) Co. is a renowned designer and supplier of analog and mixed signal ICs in the Southeast Asian market. The article provides an overview of the main categories of Corebai products, their key areas of application.
92-95
Available inductive components on the Russian market
Abstract
The company RU Electronics is constantly expanding the range of supplied electronic components. The article provides an overview of inductive components that have recently replenished the RU Electronics warehouse and are designed to replace the solutions from such companies as Bourns, TDK, Sumida, Murata, Wurth, etc.
96-98
Microwave electronics
102-108
Design solutions
New metal-ceramic packages from ZPP JSC
Abstract
The article considers the characteristics and features of new metal-ceramic packages from Semiconductor Devices Plant JSC (ZPP JSC). It is noted that in terms of their technical characteristics, these packages are at the level of the best world achievements.
110-113
Information and telecommunication systems
Intelligent navigation of unmanned agricultural machinery
Abstract
Improving the efficiency of agricultural production is associated with the introduction of robotic and unmanned systems, which include the development of unmanned agricultural machinery. The article analyses the existing technologies of intelligent navigation, allowing to ensure the complete autonomy of unmanned agricultural machinery.
114-120
Test and measurement
New generation neutron spectrometer-dosimeter
Abstract
The article describes SDMF-1608SN new generation small-sized digital spectrometer-dosimeter of neutrons and gamma rays, which allows measuring the energy distribution of the neutron and gamma-ray flux density and calculating any dosimetric functional. Examples of measurements of the spectra of radionuclide gamma and neutron sources, accelerators, generators and reactors are provided.
122-128
Measuring shape defects with quaternion geometric transformation algorithms
Abstract
To analyze and identify shape defects and reduce the interference of methodological and systematic errors of the operator and the environment, an algorithm for filtering the values of the measured section of the part is used.
130-136
Rationale for the use of a noise-suppressing circuit of a non-contact sensor for measuring geometry defects
Abstract
A prototype of a non-contact capacitive sensor for measuring shape defects for import substitution of an Austrian-made contact probe has been created. The article presents the results of theoretical substantiation, studies of technical and methodological solutions for the creation of optical digital devices that can be used to measure shape and roughness defects.
138-146