Enviar artigo por via de e-mail Chasing excellence: from deep machine learning to artificial intelligence in Maker-Ray AOI systems. Part 2
- Autores: Rozhkov I.1, Garanin A.1, Podolsky D.1
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Afiliações:
- ООО «Новые Технологии»
- Edição: Nº 3 (2024)
- Páginas: 200-206
- Seção: Manufacturing equipment and process materials
- URL: https://journals.eco-vector.com/1992-4178/article/view/631761
- DOI: https://doi.org/10.22184/1992-4178.2024.234.3.200.206
- ID: 631761
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Resumo
In the first part of the article, published in «ELECTRONICS: Science, Technology, Business» No. 10/2023 journal, the effectiveness of the use of artificial intelligence (AI) was substantiated as the next step in the development of machine learning algorithms in image analysis. The second part discusses the theory and practice of building a virtual model for the operation of artificial intelligence used in Maker-Ray optical inspection systems.
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Sobre autores
I. Rozhkov
ООО «Новые Технологии»
Autor responsável pela correspondência
Email: rozhkov@nt-smt.ru
генеральный директор, управляющий партнер
RússiaA. Garanin
ООО «Новые Технологии»
Email: garanin@nt-smt.ru
технический директор, управляющий партнер
RússiaD. Podolsky
ООО «Новые Технологии»
Email: podolsky@nt-smt.ru
ведущий менеджер по продуктам
RússiaArquivos suplementares
