Email this article Solutions for measuring and calibrating electronic component parameters in a temperature range from T°Lab
- Authors: Glazunov R.1
-
Affiliations:
- ООО «ОТК»
- Issue: No 8 (2025)
- Pages: 76-80
- Section: Reliability and validation
- URL: https://journals.eco-vector.com/1992-4178/article/view/695971
- DOI: https://doi.org/10.22184/1992-4178.2025.250.8.76.80
- ID: 695971
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Abstract
The article summarizes T°Lab’s experience in creating measurement and calibration rigs for electronic components across a wide temperature range. The proposed solutions simplify operations, improve reliability, and significantly reduce the cost of test equipment.
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About the authors
R. Glazunov
ООО «ОТК»
Author for correspondence.
Email: journal@electronics.ru
директор
Russian Federation, МоскваSupplementary files
Supplementary Files
Action
1.
JATS XML
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Fig. 1. Installation of control parameters of the EKB UVK-1 and the development team
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Fig. 2. Thermal compensation unit UTK-3a (export to Taiwan)
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Fig. 3. Examples of typical test benches based on cable assemblies
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Fig. 4. Solution based on test and motherboard PCBs
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Fig. 5. Example of a test board and product adapters
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Fig. 6. Thermal training stand with vertical design based on test and motherboard printed circuit boards
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Fig. 7. Solution based on mechanical switching of the RF signal
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Fig. 8. Contact head amplifier board – active probe
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Fig. 9. Solutions with an independent foundation for the object table: a – chamber on a raised floor; b – chamber on the same base as the foundation
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