Enviar artigo por via de e-mail Solutions for measuring and calibrating electronic component parameters in a temperature range from T°Lab
- Autores: Glazunov R.1
-
Afiliações:
- ООО «ОТК»
- Edição: Nº 8 (2025)
- Páginas: 76-80
- Seção: Reliability and validation
- URL: https://journals.eco-vector.com/1992-4178/article/view/695971
- DOI: https://doi.org/10.22184/1992-4178.2025.250.8.76.80
- ID: 695971
Citar
Texto integral
Acesso aberto
Acesso está concedido
Acesso é pago ou somente para assinantes
Resumo
The article summarizes T°Lab’s experience in creating measurement and calibration rigs for electronic components across a wide temperature range. The proposed solutions simplify operations, improve reliability, and significantly reduce the cost of test equipment.
Palavras-chave
Texto integral
Sobre autores
R. Glazunov
ООО «ОТК»
Autor responsável pela correspondência
Email: journal@electronics.ru
директор
Rússia, МоскваArquivos suplementares
Arquivos suplementares
Ação
1.
JATS XML
2.
Fig. 1. Installation of control parameters of the EKB UVK-1 and the development team
Baixar (515KB)
3.
Fig. 2. Thermal compensation unit UTK-3a (export to Taiwan)
Baixar (635KB)
4.
Fig. 3. Examples of typical test benches based on cable assemblies
Baixar (442KB)
5.
Fig. 4. Solution based on test and motherboard PCBs
Baixar (670KB)
6.
Fig. 5. Example of a test board and product adapters
Baixar (281KB)
7.
Fig. 6. Thermal training stand with vertical design based on test and motherboard printed circuit boards
Baixar (301KB)
8.
Fig. 7. Solution based on mechanical switching of the RF signal
Baixar (304KB)
9.
Fig. 8. Contact head amplifier board – active probe
Baixar (254KB)
10.
Fig. 9. Solutions with an independent foundation for the object table: a – chamber on a raised floor; b – chamber on the same base as the foundation
Baixar (237KB)
