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KOMPAS-3D from ASCON is a professional tool for designing technological equipment for metal-ceramic production
Smorkalov D., Zhirnov O., Shugaepov S., Egoshin V., Akhmetgaliev R.
Test telemetry generator: accelerating the development of software for control systems products in the absence of a product and its test equipment
Belov S.
Deepening self-diagnosis of test and verification equipment of control systems: migration from Windows to Linux
Belov S.
Equipment and methods for semiconductor die mounting
Mandrik I., Novozhilov I.
Social and psychological aspects of the implementation of technological equipment monitoring systems and their impact on improving the efficiency of machine-building enterprises
Vorotilin M., Karavdin L., Minakov E., Yanov E.
Improving the reliability characteristics of multi-lead metal-ceramic packages from ZPP JSC through the use of test systems
Ermilov R., Shugaepov S., Ermolaev E., Egoshin V.
Basic mechanisms of influence of special factors on the semiconductor structure
Selin D.
Application of algorithmic methods in the process of simulation modeling of technological processes
Lijn E., Khomutskaya O., Vantsov S.
Parallel imports and sanctions risks: how to avoid the invasion of «frankensteins»
Zaitsev A.
Fiber-optic gyroscopes and systems based on them. Part 2
Berezina Y.
Methods for measuring S-parameters of high-speed connectors using vector network analyzers
Krylov A., Krekoten F., Pankov A.
Formation of a data package of coordinate measurements in shape, contour, location control tools
Epifantsev K.
1 - 12 of 12 Items

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