AUTOMATIC DEVICE FOR MEASURING RESISTIVITY OF SILICON FOUR-POINT PROBE METHOD
- Autores: Vladimirov VM1, Grinin EF1, Sergiy ME1, Shepov VN1
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Afiliações:
- Edição: Volume 10, Nº 4 (2009)
- Páginas: 42-45
- Seção: Articles
- URL: https://journals.eco-vector.com/2712-8970/article/view/508534
- ID: 508534
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Resumo
An automatic device for measuring the resistivity of single-crystalline silicon by means of the four-point probe method had been developed.
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Bibliografia
- ГОСТ 19658-81. Кремний монокристаллический в слитках. М. : Изд-во стандартов, 1990.