Methodology for conducting incoming inspection of ICs in metal-ceramic packages

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Abstract

The article examines the resources and competencies required to conduct incoming inspection of ICs in metal-ceramic packages, as well as the difficulties that arise when inspecting foreign-made packages associated with the need to focus on foreign standards.

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About the authors

A. Alontsev

АО «ТЕСТПРИБОР»

Author for correspondence.
Email: kys@electronics.ru

главный конструктор

Russian Federation

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1. JATS XML
2. Fig. 1. Microcircuit in DLGA package

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3. Fig. 2. Microcircuits in CLGA/CBGA package

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4. Fig. 3. Chips in CQFP package

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5. Fig. 4. Microcircuit in CLCC/CQFN package

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Copyright (c) 2024 Alontsev A.