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Current look at burn-in testing FTT-17.xx.xxx series stands from “Sovtest ATE”
Roslyakov A., Malyshev R.
Design of an electronic board for a dew point temperature converter
Mihin S., Koshkur O., Ganzha V., Romanov A.
Application of algorithmic methods in the process of simulation modeling of technological processes
Lijn E., Khomutskaya O., Vantsov S.
Investigation of laser scanning systems for measuring shape defects
Epifantsev K.
Contract manufacturing of iсs. The world's leading silicon fabs increase capacities
Makushin M.
Reliability and security of operating systems of various architectures. Part 2
Nazarov S., Barsukov A.
Influence of design parameters on plane strain of printed circuit boards
Vantsov S., Khomutskaya O., Liin E.
Chasing excellence: from deep machine learning to artificial intelligence in maker- ray aoi systems. Part 1
Rozhkov I., Garanin A., Podolsky D.
Engineering approach to the selection of new manufacturers of microwave components from China
Konakov S.
Domestic GaN Microwave Transistors with a Design Support Kit from «PKK Milandr» JSC and Amplifier Modules Based on Them
Polunin M., Tarasov S., Glushkov G.
Development of AMR converter mathematical model for implementation in CAD
Cheplakov A., Litvinenko E.
Identification of analog measuring instruments readings using neural networks
Chuprinova O.
Globalization and monopolization of microelectronics in current conditions
Shelepin N.
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