电邮这篇文章 Photon emission is an innovative method for analyzing defects in microelectronics
- 作者: Plebanovich V.1, Svetenkova V.2, Grishkevich V.2
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隶属关系:
- ОАО «Планар»
- ОАО «Оптоэлектронные системы»
- 期: 编号 6 (2025)
- 页面: 150-152
- 栏目: Reliability and validation
- URL: https://journals.eco-vector.com/1992-4178/article/view/688740
- DOI: https://doi.org/10.22184/1992-4178.2025.247.6.150.152
- ID: 688740
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详细
The analytical complex “Photon”, developed jointly by “Optoelectronic systems” JSC and NTC “Belmicrosystems”, solves the problem of identifying hidden defects of integrated circuits, such as structural defects of the crystal lattice, local current leaks and overheating of power elements.
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作者简介
V. Plebanovich
ОАО «Планар»
编辑信件的主要联系方式.
Email: vpleba@planar.by
д.т.н.
白俄罗斯, MinskV. Svetenkova
ОАО «Оптоэлектронные системы»
Email: marketing@optes.by
白俄罗斯, Minsk
V. Grishkevich
ОАО «Оптоэлектронные системы»
Email: marketing@optes.by
白俄罗斯, Minsk
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