A STUDY ON THE IRON STRUCTURE FORMATIONON SILICON SURFACES FOR DIFFERENT TECHNOLOGICAL CONDITIONSBY MEANS OF ATOMIC FORCE MICROSCOPY
- Authors: Alexandrova GA1, Vaituzin OP1, Berezitskaya EP1, Parshin AS1, Varnakov SN1, Ovchinnikov SG1
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Affiliations:
- Issue: Vol 10, No 4 (2009)
- Pages: 125-129
- Section: Articles
- URL: https://journals.eco-vector.com/2712-8970/article/view/508623
- ID: 508623
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Abstract
About the authors
G A Alexandrova
O P Vaituzin
E P Berezitskaya
A S Parshin
S N Varnakov
S G Ovchinnikov
References
- Миронов, В. Л. Основы сканирующей зондовой микроскопии / В. Л. Миронов. М. : Техносфера, 2005.
- Ishizaka, A. / A. Ishizaka, Y . Shiraki / / A. J. Electrochem. Soc.: Electrochemical sciense and Techology. 1986. P . 666-671.
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