A STUDY ON THE IRON STRUCTURE FORMATIONON SILICON SURFACES FOR DIFFERENT TECHNOLOGICAL CONDITIONSBY MEANS OF ATOMIC FORCE MICROSCOPY


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Abstract

This research is about the iron-silicon surface topology structures acquired by means of Atomic Force Microscopy. The temperature conditions used for obtaining these samples vary.

References

  1. Миронов, В. Л. Основы сканирующей зондовой микроскопии / В. Л. Миронов. М. : Техносфера, 2005.
  2. Ishizaka, A. / A. Ishizaka, Y . Shiraki / / A. J. Electrochem. Soc.: Electrochemical sciense and Techology. 1986. P . 666-671.

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Copyright (c) 2009 Alexandrova G.A., Vaituzin O.P., Berezitskaya E.P., Parshin A.S., Varnakov S.N., Ovchinnikov S.G.

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