A STUDY ON THE IRON STRUCTURE FORMATIONON SILICON SURFACES FOR DIFFERENT TECHNOLOGICAL CONDITIONSBY MEANS OF ATOMIC FORCE MICROSCOPY


如何引用文章

全文:

详细

This research is about the iron-silicon surface topology structures acquired by means of Atomic Force Microscopy. The temperature conditions used for obtaining these samples vary.

参考

  1. Миронов, В. Л. Основы сканирующей зондовой микроскопии / В. Л. Миронов. М. : Техносфера, 2005.
  2. Ishizaka, A. / A. Ishizaka, Y . Shiraki / / A. J. Electrochem. Soc.: Electrochemical sciense and Techology. 1986. P . 666-671.

补充文件

附件文件
动作
1. JATS XML

版权所有 © Alexandrova G.A., Vaituzin O.P., Berezitskaya E.P., Parshin A.S., Varnakov S.N., Ovchinnikov S.G., 2009

Creative Commons License
此作品已接受知识共享署名 4.0国际许可协议的许可